Cairo University

MTPR Journal

 

FOUR-DIMENSIONAL ULTRAFAST ELECTRON MICROSCOPY (4D UEM)

2016-12-17
Mohamed Mahgoob
Center for Imaging and microscopy (CIM), Zewail City of
Science and Technology

Vol./Issue: 16 , id: 223

The four-dimensional ultrafast electron microscopy (4D UEM) is a cutting-edge technique which has become a promising tool for visualizing atomic-scale motions in all four dimensions of space and time, aiming to image the electron dynamics in real-time scale. In this talk I will describe the four-dimensional ultrafast electron microscopy (4D UEM) developed at Caltech, which resulted in a number of patents and publications by Dr. Zewail as well as summarizing applications that investigate ultrafast phenomena with the time scale of a millionth of a billionth of a second, the femtosecond which is pivotal to understanding the dynamic processes of nano-objects. In particular, I will describe the photon-induced near-field electron microscopy (PINEM) allowing us to observe the Plasmon fields of nanoparticle via the measurement of photon-electron interaction. I will also present the latest developments in preparing the proper infrastructure and setting up the 4D UEM that will be operational next year and will be part of Zewail City’s facilities in imaging and nanotechnology.