In this work, a series of Silver Oxide (AgO)thin films on silicon substrates by pulsed laser deposition (PLD) are studied at different deposition conditions and constant oxygen pressure 0.3 mbar. The thin films were prepared by Nd:YAG laser (1064 & 532 nm) with 10 Hz repetition rate and 6 ns pulse duration.The effects of ablation time (Tab) on the structural and optical properties ofAgO thin films by grazing incident X-ray diffraction (GIXRD).XRD and TEM result confirmed that the structure of the films prepared by the fundamental wavelength of Nd:YAGlaser at constant oxygen pressure 0.3 mbar were nanocrystalline monoclinic AgO. The optical band gap of the thin films which prepared using the fundamental and second harmonic of Nd:YAG laserdecreases with increasing the Tab. The partical size (Ps) of nanocrystallineAgO thin film increases by increasing the ablation time Tab that effects on the optical properties of the AgO films. The controlling of the optical properties thin films which were prepared by PLD technique could be arbitrated for certain application with controlling the ablation time Tab at fixed constant oxygen pressure. Influence The polycrystalline of cubic inverse spinel structure with the appearance of secondary phase was appeared at 900oC. The Raman spectra gave the peaks corresponding to the tetrahedral and octahedral groups. VSM measurements showed that enhancement of magnetization with an increase annealing temperatures.
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